| 年度 | 2018 |
|---|---|
| 全部作者 | Jen-Ching Huang, Yaozeng Hu, Yi-Chia Liao and Hui-Shan Chou |
| 論文名稱 | Effects of probe downforce and bias voltage on electrochemical atomic force microscopy nanomachining of copper materials |
| 會議名稱 | 2018 International Seminar on Computer Science and Engineering Technology (SCSET 2018) |
| 地點 | 中國China - 上海 |
| 著作人數 | 3 |